The IEEE Transactions on Computer-Aided Design (TK7874.I327, ISSN 0278-0070) contains papers and tutorials on routing (with an emphasis on algorithms). The Proceedings of the ACM/IEEE Design Automation Conference (DAC, TA174.D46a, ISSN 0146-7123, catalogued under various titles) and the Proceedings of the IEEE International Conference on Computer-Aided Design ( ICCAD, TK7874.I3235a, ISSN 1063-6757 and 1092-3152) document the two conferences at which new ideas on routing are often presented.
The edited book by Preas and Lorenzetti  is the best place to learn more about routing. Books by Sarrafzadeh and Wong  and Sait and Youssef  are more recent introductions to physical design including routing. The book Hu and Kuh  edited for IEEE Press contains early papers on routing, including an introductory paper with many references. Ohtsuki’s  edited book on layout contains tutorials on routing, including reviews of channel routing by Burstein and area routing by Ohtsuki; a more recent edited book by Zobrist  also contains papers on routing. A good introduction to routing is Joobanni’s thesis published as a book [ 1986]. New routing techniques are becoming important for FPGAs, a recent paper describes some of these [ Roy, 1993]. Books by Lengauer [ 1990] and Sherwani  describe algorithms for both the global and detailed routing problems. A book by Sherwani et al.  covers two-level and three-level routing. Kahng and Robins [ 1995] cover timing-driven detailed routing in their book; Sapatnekar and Kang  cover timing-driven physical design in general. The book by Pillage et al.  includes a chapter on bounding and asymptotic approximations that are related to the models used in SPF. Nakhla and Zhang  and Goel  cover modeling of interconnect. The IEEE Press book edited by Friedman  covers clock distribution. Routing is often performed in parallel on several machines; books by Banerjee  and Ravikumar  describe parallel algorithms for physical design. Taylor and Russell  review knowledge-based physical design in an edited book.
Najm’s review paper covers power estimation . Books by Shenai  and Murarka [ 1993] cover all aspects of metallization. To learn more about the causes of electromigration in particular, see D’Heurle’s [ 1971] classic paper and a paper by Black [ 1969]. The edited book by Gildenblat and Schwartz  covers metallization reliability. A tutorial paper by Young and Christou  reviews current theories of the causes of electromigration. To learn more about masks and microlithography in VLSI, see the handbook by Glendinning and Helbert .